ACM Portal
  Subscribe (Full Service)    Register (Limited Service, Free)    Login
  Search:   The ACM Digital Library   The Guide
  
ACM Home Page
Please provide us with feedback. Feedback
Debugging optimized code via tailoring
Full text PdfPdf (115 KB)
Source International Symposium on Software Testing and Analysis archive
Proceedings of the 1994 ACM SIGSOFT international symposium on Software testing and analysis table of contents
Seattle, Washington, United States
Page: 201  
Year of Publication: 1994
ISBN:0-89791-683-2
Authors
Lori Pollock  University of Delaware, Newark, DE
Mary Bivens  Allegheny College Meadville, PA
Mary Lou Soffa  University of Pittsburgh, Pittsburgh, PA
Sponsor
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 2,   Downloads (12 Months): 5,   Citation Count: 0
Additional Information:

index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/186258.187201
What is a DOI?

INDEX TERMS

Primary Classification:
  D. Software
  D.2 SOFTWARE ENGINEERING
      D.2.5 Testing and Debugging

          Nouns: DEBUG

Additional Classification:
  D. Software
  D.3 PROGRAMMING LANGUAGES
      D.3.4 Processors
          Subjects: Optimization

  F. Theory of Computation
  F.3 LOGICS AND MEANINGS OF PROGRAMS
      F.3.3 Studies of Program Constructs


General Terms:
Performance, Reliability

Collaborative Colleagues:
Lori Pollock: colleagues
Mary Bivens: colleagues
Mary Lou Soffa: colleagues

The ACM Portal is published by the Association for Computing Machinery. Copyright © 2009 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player