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Focused iterative testing: a test automation case study
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Source International Conference on Management of Data archive
Proceedings of the 1st international workshop on Testing database systems table of contents
Vancouver, British Columbia, Canada
SESSION: Testing techniques table of contents
Article No. 8  
Year of Publication: 2008
ISBN:978-1-60558-233-7
Authors
Mechelle Gittens  IBM Corp.
Pramod Gupta  IBM Corp.
David Godwin  IBM Corp.
Hebert Pereyra  IBM Corp.
Jeff Riihimaki  IBM Corp.
Sponsor
SIGMOD: ACM Special Interest Group on Management of Data
Publisher
ACM  New York, NY, USA
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ABSTRACT

Timing-related defects are among the most difficult types of defects to catch while testing software. They are by definition difficult to reproduce and hence difficult to debug. Not all components of a software system have timing-related defects. For example, either a parser can analyze an input or it cannot. However, systems that have concurrent threads such as database systems are prone to timing-related defects. As a result, software developers must tailor testing to exploit vulnerabilities that occur because of threading. This paper presents the Focused Iterative Testing (FIT) approach, which uses a repetitive and iterative approach to find timing-related defects and target product areas with multithreaded characteristics by executing system tests with a multi-user test suite.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Mechelle Gittens: colleagues
Pramod Gupta: colleagues
David Godwin: colleagues
Hebert Pereyra: colleagues
Jeff Riihimaki: colleagues