| Predicting cluster tool behavior with slow down factors |
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Winter Simulation Conference
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Proceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come
table of contents
Washington D.C.
SESSION: Semiconductor manufacturing: semiconductor manufacturing equipment modeling
table of contents
Pages 1755-1760
Year of Publication: 2007
ISBN:1-4244-1306-0
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IEEE Press
Piscataway, NJ, USA
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Downloads (6 Weeks): 1, Downloads (12 Months): 15, Citation Count: 1
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ABSTRACT
Cluster tools are representatives of a special kind of tool where process times of jobs depend on the combination in which they are processed together on the tool and hence, depending on the sequence in which they are processed at a tool. To evaluate schedules of jobs to be processed at such a tool an estimation method is needed since a detailed simulation takes too long. In this paper, we present a method based on slow down factors which produces promising results and gives hints for the development of intelligent scheduling methods for this kind of tools.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Atherton, L. F., and R. W. Atherton. 1995. Wafer Fabrication: Factory Performance and Analysis. Kluwer.
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Joo, Y.-J., and T.-E. Lee. 2004. Virtual Control: A Virtual Cluster Tool for Testing and Verifying a Cluster Tool Controller and a Scheduler. IEEE Robotics & Automation Magazine, 11(3), 33--49.
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Niedermayer, H., and Rose, O. 2003. A Simulation-based Analysis of the Cycle Time of Cluster Tools in Semiconductor Manufacturing. In Proceedings of the 15th European Simulation Symposium.
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Perkinson, T. L., P. K. McLarty, R. S. Gyurcsik, and R. K. Cavin III. 1994. Single-Wafer Cluster Tool Performance: An Analysis of Throughput. IEEE Transactions on Semiconductor Manufacturing, 7 (3), 369--373.
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Perkinson, T. L., P. K. McLarty, R. S. Gyurcsik, and R. K. Cavin III. 1996. Single-Wafer Cluster Tool Performance: An Analysis of the Effects of Redundant Chambers and Revisitation Sequences on Throughput. IEEE Transactions on Semiconductor Manufacturing, 9 (3), 384--400.
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