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A Bayesian approach to analysis of limit standards
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Source Winter Simulation Conference archive
Proceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come table of contents
Washington D.C.
SESSION: Analysis methodology B: recent advances in simulation analysis table of contents
Pages 544-552  
Year of Publication: 2007
ISBN:1-4244-1306-0
Authors
Roy R. Creasey, Jr.  Longwood University, Farmville, VA
K. Preston White, Jr.  University of Virginia, Charlottesville, VA
Sponsors
INFORMS-SIM : Institute for Operations Research and the Management Sciences: Simulation Society
NIST : National Institute of Standards and Technology
(SCS) : The Society for Modeling and Simulation International
ACM/SIGSIM : Association for Computing Machinery: Special Interest Group on Simulation
IIE : Institute of Industrial Engineers
ASA : American Statistical Association
IEEE/SMC : Institute of Electrical and Electronics Engineers: Systems, Man, and Cybernetics Society
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 25,   Citation Count: 1
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ABSTRACT

Limit standards are probabilistic requirements or benchmarks regarding the proportion of replications conforming or not conforming to a desired threshold. Sample proportions resulting from the analysis of replications are known to be beta distributed. As a result, standard constructs for defining a confidence interval on such a proportion, based on critical points from the normal or Student's t distribution, are increasingly inaccurate as the mean sample proportion approaches the limits of 0 or 1. We consider the Bayesian relationship between the beta and binomial distributions as the foundation for a sequential methodology in the analysis of limit standards. The benefits of using the beta distribution methodology are variance reduction, and smaller sample size (when compared to other analysis methodologies).


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Chen, E. and W. Kelton (2004). "Quantile and tolerance-interval estimation in simulation," accepted for European Journal of Operational Research.
 
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Cochran, W. (1963). Sampling Techniques, 2nd ed. New York: Wiley.
 
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Johnson, N., S. Kotz, and N. Balakrishnan (1994). Continuous Univariate Distributions, 2nd ed., New York: John Wiley & Sons, Inc.
 
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Johnson, N., A. Kemp, S. Kotz (2005). Univariate Discrete Distributions, 3rd. ed. Hoboken, NJ: John Wiley & Sons, Inc.
 
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Lee, P. (1997). Bayesian Statistics: An Introduction, 2nd ed., New York: John Wiley & Sons, Inc.
 
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White, K., K. Johnson, T. Adams, C. Everline, and R. Creasey (2007). "Best practices and recommended statistical techniques for developing Monte Carlo sampling plans." NASA Technical Paper.

Collaborative Colleagues:
Roy R. Creasey, Jr.: colleagues
K. Preston White, Jr.: colleagues