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A nonlinear cell macromodel for digital applications
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Source International Conference on Computer Aided Design archive
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Advanced models for static timing analysis table of contents
Pages 678-685  
Year of Publication: 2007
ISBN ~ ISSN:1092-3152 , 1-4244-1382-6
Authors
Chandramouli Kashyap  Intel Corporation, Hillsboro, OR
Chirayu Amin  Intel Corporation, Hillsboro, OR
Noel Menezes  Intel Corporation, Hillsboro, OR
Eli Chiprout  Intel Corporation, Hillsboro, OR
Sponsors
: IEEE CASS/CANDE
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS\DATC : IEEE Computer Society
CEDA : Council on Electronic Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 3,   Downloads (12 Months): 61,   Citation Count: 3
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abstract   references   cited by   collaborative colleagues  

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ABSTRACT

Current source models have emerged as a promising technique for reducing digital cell netlists to a simpler electrical model for use in timing and other applications. The Multiport Current Source Model (MCSM) is one of the most general models in this class, which has been shown to handle multiple electrical effects including multiple-input switching (MIS) events in timing. However, this new model is hampered by two major problems: port characterization runtime and accuracy across a range of complicated cells which are deployed in advanced microprocessor design such as complex combinational cells, muxes, and sequentials. In this paper we demonstrate a significant leap in modeling accuracy and characterization runtime over the MCSM model which effectively eliminates these remaining issues. The quality of the new approach is conclusively demonstrated on a comprehensive 45nm cell library currently in use. The new approach accurately models both complex combinational as well as, for the first time, sequential cells, and puts MCSMs on the path for next generation gate level electrical analysis.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Collaborative Colleagues:
Chandramouli Kashyap: colleagues
Chirayu Amin: colleagues
Noel Menezes: colleagues
Eli Chiprout: colleagues