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Solving the MAXSAT problem using a multivariate EDA based on Markov networks
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Genetic And Evolutionary Computation Conference archive
Proceedings of the 2007 GECCO conference companion on Genetic and evolutionary computation table of contents
London, United Kingdom
SESSION: Late-breaking papers table of contents
Pages 2423-2428  
Year of Publication: 2007
ISBN:978-1-59593-698-1
Authors
Alexander E. I. Brownlee  The Robert Gordon University, Aberdeen, United Kingdom
John A. W. McCall  The Robert Gordon University, Aberdeen, United Kingdom
Deryck F. Brown  The Robert Gordon University, Aberdeen, United Kingdom
Sponsors
ACM: Association for Computing Machinery
SIGEVO: ACM Special Interest Group on Genetic and Evolutionary Computation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Markov Networks (also known as Markov Random Fields) have been proposed as a new approach to probabilistic modelling in Estimation of Distribution Algorithms (EDAs). An EDA employing this approach called Distribution Estimation Using Markov Networks (DEUM) has been proposed and shown to work well on a variety of problems, using a unique fitness modelling approach. Previously DEUM has only been demonstrated on univariate and bivariate complexity problems. Here we show that it can be extended to a difficult multivariate problem and is capable of accurately modelling a fitness function and locating an optimum with a very small number of function evaluations.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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SHAKYA, S.K. 2006. DEUM: A framework for an Estimation of Distribution Algorithm based on Markov Random Fields. PhD Thesis, The Robert Gordon University, Aberdeen, UK.
 
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SHAKYA, S. K., MCCALL, J. A. W. AND BROWN, D. F. 2006. Solving the Ising Spin Glass Problem using a bivariate EDA based on Markov Random Fields. In Proceedings of IEEE Congress on Evolutionary Computation (IEEE CEC 2006), Vancouver, Canada, 16-21 July 2006, IEEE Press.
 
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Collaborative Colleagues:
Alexander E. I. Brownlee: colleagues
John A. W. McCall: colleagues
Deryck F. Brown: colleagues