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ABSTRACT
Algorithmic techniques for formal verification can be used not just for bug-finding, but also to estimate vulnerability to reliability problems and to reduce overheads of circuit mechanisms for error resilience. We demonstrate this idea of verification-guided error resilience in the context of soft errors in latches. We show how model checking can be used to identify latches in a circuit that must be protected in order that the circuit satisfies a formal specification. Experimental results on a Verilog implementation of the ESA SpaceWire communication protocol indicate that the power overhead of soft error protection can be reduced by a factor of 4.35 by using our approach rather than protecting all latches.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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1
|
Cadence SMV model checker. http://www.kenmcmil.com/smv.html.
|
| |
2
|
SpaceWire Verilog. http://www.opencores.org/projects.cgi/web/spacewire/overview, July 2005.
|
| |
3
|
IEEE P1850 - standard for PSL - property specification language. http://www.eda.org/ieee-1850/, URL circa Sep.'06.
|
| |
4
|
|
| |
5
|
R. C. Baumann. The impact of technology scaling on soft error rate performance and limits to the efficiency of error correction. In Proc. IEDM, pages 329--332, 2002.
|
| |
6
|
H. Chockler, O. Kupferman, and M. Y. Vardi. Coverage metrics for formal verification. In Proc. CHARME, LNCS 2860, pages 111--125, 2003.
|
| |
7
|
E. M. Clarke, O. Grumberg, and D. A. Peled. Model Checking. MIT Press, 2000.
|
| |
8
|
European Cooperation for Space Standardization. Space engineering - SpaceWire - links, nodes, routers, and networks (draft ECSS-E-50-12A). http://www.spacewire.esa.int/tech/spacewire/standards/, November 2002.
|
| |
9
|
|
 |
10
|
Yatin Hoskote , Timothy Kam , Pei-Hsin Ho , Xudong Zhao, Coverage estimation for symbolic model checking, Proceedings of the 36th ACM/IEEE conference on Design automation, p.300-305, June 21-25, 1999, New Orleans, Louisiana, United States
[doi> 10.1145/309847.309936]
|
| |
11
|
|
| |
12
|
|
| |
13
|
U. Krautz , M. Pflanz , C. Jacobi , H. W. Tast , K. Weber , H. T. Vierhaus, Evaluating coverage of error detection logic for soft errors using formal methods, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
|
| |
14
|
|
| |
15
|
|
 |
16
|
Subhasish Mitra , Tanay Karnik , Norbert Seifert , Ming Zhang, Logic soft errors in sub-65nm technologies design and CAD challenges, Proceedings of the 42nd annual conference on Design automation, June 13-17, 2005, Anaheim, California, USA
[doi> 10.1145/1065579.1065585]
|
| |
17
|
M. Nicolaidis. Design for soft error mitigation. IEEE Trans. Device and Matl. Reliability, 5(3):405--418, Sept. 2005.
|
| |
18
|
|
| |
19
|
|
| |
20
|
M. Zhang, S. Mitra, T. M. Mak, N. Seifert, Q. Shi, K. Kim, N. Shanbhag, N. Wang, and S. Patel. Sequential element design with built-in soft error resilience. IEEE Transactions on VLSI, Dec. 2006.
|
CITED BY 3
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Orna Kupferman , Wenchao Li , Sanjit A. Seshia, A theory of mutations with applications to vacuity, coverage, and fault tolerance, Proceedings of the 2008 International Conference on Formal Methods in Computer-Aided Design, p.1-9, November 17-20, 2008, Portland, Oregon
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