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Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Nice, France
SESSION: Statistical/nonlinear analysis and verification for analogue circuits table of contents
Pages: 261 - 266  
Year of Publication: 2007
ISBN:978-3-9810801-2-4
Authors
Jonathan Borremans  IMEC, Leuven, Belgium and Vrije Universiteit Brussel, Brussels, Belgium
Ludwig De Locht  IMEC, Leuven, Belgium and Vrije Universiteit Brussel, Brussels, Belgium
Piet Wambacq  IMEC, Leuven, Belgium and Vrije Universiteit Brussel, Brussels, Belgium
Yves Rolain  Vrije Universiteit Brussel, Brussels, Belgium
Sponsors
: IEEE Council on Electronic Design Automation (CEDA)
: The EDA Consortium
EDAA : European Design and Automation Association
SIGDA : ACM Design Automation
RAS : RAS
: The IEEE Computer Society TTTC
: ECSI
Publisher
EDA Consortium  San Jose, CA, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 30,   Citation Count: 0
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ABSTRACT

Modern integrated radio systems require highly linear analog/RF circuits. Two-tone simulations are commonly used to study a circuit's nonlinear behavior. Very often, however, this approach suffers limited insight. To gain insight into nonlinear behavior, we use a multisine analysis methodology to locate the main nonlinear components (e.g. transistors) both for weakly and strongly nonlinear behavior. Under weakly nonlinear conditions, selective Volterra analysis is used to further determine the most important nonlinearities of the main nonlinear components. As shown with an example of a 90 nm CMOS wideband low-noise amplifier, the insights obtained with this approach can be used to reduce nonlinear circuit behavior, in this case with 10 dB. The approach is valid for wideband and thus practical excitation signals, and is easily applicable both to simple and complex circuits.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Mos Model 11. http://www.semiconductors.philips.com/Philips_Models/mos_models/model11.
 
2
J. Schoukens et al. Linear modeling in the presence of nonlinear distortions. IEEE Trans. Instrum. Meas., 16(4):786--792, August 2002.
 
3
K. Vanhoenacker et al. Design of multisine excitations to characterize the nonlinear distortions during frf-measurements. IEEE Trans. Instrum. Meas., 50(5):1097--1102, October 2001.
 
4
L. De Locht et al. Identifying the main nonlinear contributions: use of multisine excitations during circuit design. ARFTG Microwave Measurements Conference, pages 75--84, December 2004.
 
5
P. Dobrovolný et al. Analysis and compact behavioral modeling of nonlinear distortion in analog communication circuits. IEEE Trans. Computer-Aided Design 22(9), 22(9):1215--1227, September 2003.
 
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P. Li and L. Pileggi. Efficient per-nonlinearity distortion analysis fior analog and rf circuits. IEEE Trans. Computer-Aided Design 22(9), 22(10):1297--1309, October 2003.
 
7
SpectreRF. http://www.cadence.com/products/custom_ic/spectrerf.
 
8
Collaborative Colleagues:
Jonathan Borremans: colleagues
Ludwig De Locht: colleagues
Piet Wambacq: colleagues
Yves Rolain: colleagues