ACM Home Page
Please provide us with feedback. Feedback
A new paradigm for low-power, variation-tolerant circuit synthesis using critical path isolation
Full text PdfPdf (327 KB)
Source International Conference on Computer Aided Design archive
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Architectural design techniques for high performance and robustness table of contents
Pages: 619 - 624  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Swaroop Ghosh  Purdue University, IN
Swarup Bhunia  Case Western Reserve University, OH
Kaushik Roy  Purdue University, IN
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 3,   Downloads (12 Months): 47,   Citation Count: 3
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1233501.1233628
What is a DOI?

ABSTRACT

Design considerations for robustness with respect to variations and low power operations typically impose contradictory design requirements. Low power design techniques such as voltage scaling, dual-Vth etc. can have a large negative impact on parametric yield. In this paper, we propose a novel paradigm for low-power variationtolerant circuit design, which allows aggressive voltage scaling. The principal idea is to (a) isolate and predict the set of possible paths that may become critical under process variations, (b) ensure that they are activated rarely, and (c) avoid possible delay failures in the critical paths by dynamically switching to two-cycle operation (assuming all standard operations are single cycle), when they are activated. This allows us to operate the circuit at reduced supply voltage while achieving the required yield. Simulation results on a set of benchmark circuits at 70nm process technology show average power reduction of 60% with less than 10% performance overhead and 18% overhead in die-area compared to conventional synthesis. Application of the proposed methodology to pipelined design is also investigated.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

1
2
 
3
4
 
5
 
6
BPTM 70nm: Berkeley predictive technology model.
7
8
 
9
S. Kundu et al., Design of robustly testable combinational logic circuits, TCAD, 1991.
 
10
Synopsys Design Compiler, www.synopsys.com.
 
11
 
12
B. C. Paul et al., Novel sizing algorithm for yield improvement under process variation in nanometer, DAC, 2004.


Collaborative Colleagues:
Swaroop Ghosh: colleagues
Swarup Bhunia: colleagues
Kaushik Roy: colleagues