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ABSTRACT
This tutorial will present recent results in robust low power computing. The perspective will be microarchitectural: what limitations does it put on the microarchitecture and what can the microarchitect do to reduce the dependency on power and improve robustness? The tutorial will start with a technology overview that charts future trends in power and reliability. We will present a summary of prior research in dynamic power reduction in microarchitectures, and give some examples of industrial solutions. We will also review prior research in microarchitectural reduction of leakage performed by us and others. While the continued scaling that Moore's Law predicts is in many ways good for reducing power, scaling also reduces reliability by increasing uncertainty in device performance. Therefore, in order to take advantage of scaling, it will be necessary to compute in the presence of various types of silicon-related faults. Two that are particularly important are single-event upsets, and, even more serious, gates that will not meet their specifications. We will review techniques to provide robustness in light of these trends. In particular, we will revisit techniques developed by the fault-tolerant community as well as newer ideas in timing speculation, exemplified by our Razor research.The tutorial is intended for computer architects and circuit designers interested in a better understanding of current reliability challenges and emerging technologies to address them. INDEX TERMS
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