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Distance-guided hybrid verification with GUIDO
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Advances in state space exploration table of contents
Pages: 1211 - 1216  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Smitha Shyam  University of Michigan, Ann Arbor, MI
Valeria Bertacco  University of Michigan, Ann Arbor, MI
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
Bibliometrics
Downloads (6 Weeks): 2,   Downloads (12 Months): 18,   Citation Count: 7
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ABSTRACT

Constrained random simulation is a widespread technique used to perform functional verification on complex digital designs, because it can generate simulation vectors at a very high rate. However, the generation of high-coverage tests remains a major challenge even in light of this high performance. In this paper we present Guido, a hybrid verification software that uses formal verification techniques to guide the simulation towards a verification goal. Guido is novel in that 1) it guides the simulation by means of a distance function derived from the circuit structure, and 2) it has a trace sequence controller that monitors and controls the direction of the simulation by striking a balance between random chance and controlled hill-climbing. We present experimental results indicating that Guido can tackle complex designs, including a picoJava microprocessor, and reach a verification goal in far fewer simulation cycles than random simulation.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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A. Hu. Formal hardware verification with BDDs: An introduction. In IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (PACRIM), pages 677--682, 1997.
 
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Sun Microsystems. PicoJava technology. http://www.sun.com/microelectronics/communitysource/picojava.
 
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Texas 97 benchmark suite. http://www-cad.eecs.berkeley.edu/Respep/Research/vis/texas-97.
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Collaborative Colleagues:
Smitha Shyam: colleagues
Valeria Bertacco: colleagues