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Coverage loss by using space compactors in presence of unknown values
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Interactive presentations table of contents
Pages: 1053 - 1054  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Mango C.-T. Chao  UC-Santa Barbara, CA
Seongmoon Wang  NEC Labs. America, Princeton, NJ
Srimat T. Chakradhar  NEC Labs. America, Princeton, NJ
Wenlong Wei  NEC Labs. America, Princeton, NJ
Kwang-Ting Cheng  UC-Santa Barbara, CA
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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J. Rajski, C. Wang, and S. M. Reddy, Convolutional Compaction Of Test Responses, IEEE International Test Conference, pp. 745--754, 2003.
 
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J. Savir, and S. Patil, Scan-based Transition Test, IEEE Trans. on Computer-Aided Design of Integrated Circuit and System, Vol.13(8), pp.1232--1241, 1993.
Collaborative Colleagues:
Mango C.-T. Chao: colleagues
Seongmoon Wang: colleagues
Srimat T. Chakradhar: colleagues
Wenlong Wei: colleagues
Kwang-Ting Cheng: colleagues