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Efficient unknown blocking using LFSR reseeding
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Interactive presentations table of contents
Pages: 1051 - 1052  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Seongmoon Wang  NEC Laboratories America, Princeton, NJ
Kedarnath J. Balakrishnan  NEC Laboratories America, Princeton, NJ
Srimat T. Chakradhar  NEC Laboratories America, Princeton, NJ
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

This paper presents an efficient method to block unknown values from entering temporal compactors. The control signals for the blocking logic are generated by an LFSR. The proposed technique minimizes the size of the LFSR by propagating only one fault effect for each fault and balancing the number of specified bits in each control pattern. The linear solver to find seeds of the LFSR intelligently chooses a solution such that the impact on test quality is minimal. Experimental results show that sizes of control data for the proposed method are smaller than prior work and run time of the proposed method is several orders of magnitude smaller than that of prior work. Hardware overhead is very low.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Naruse, I. Pomeranz, S. M. Reddy, and S. Kundu. On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. In Proceedings of IEEE International Test Conference, pages 1060--1068, 2003.
 
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Collaborative Colleagues:
Seongmoon Wang: colleagues
Kedarnath J. Balakrishnan: colleagues
Srimat T. Chakradhar: colleagues