| Enabling fine-grain leakage management by voltage anchor insertion |
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Design, Automation, and Test in Europe
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Proceedings of the conference on Design, automation and test in Europe: Proceedings
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Munich, Germany
SESSION: Leakage and dynamic power aware logic design
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Pages: 868 - 873
Year of Publication: 2006
ISBN:3-9810801-0-6
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European Design and Automation Association
3001 Leuven, Belgium, Belgium
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Downloads (6 Weeks): 2, Downloads (12 Months): 9, Citation Count: 1
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ABSTRACT
Functional unit shutdown based on MTCMOS devices is effective for leakage reduction in aggressively scaled technologies. However, the applicability of MTCMOS-based shutdown in a synthesis-based design flow poses the challenge of interfacing logic blocks in shutdown mode with active units: The outputs of inactive gates can float at intermediate voltages, causing very large short-circuit currents in the active gates they drive.In this paper, we propose two novel low-overhead elementary cells that fully address this issue. These cells can be added to any synthesis library, and they can be inserted into a netlist at the boundary between shutdown and active regions. Our results show that: (i) Our cells solve the interfacing problem with minimum overhead; (ii) A non-intrusive design flow enhancement is sufficient to automatically insert interface cells in post-synthesis netlists.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY
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Ashoka Sathanur , Antonio Pullini , Luca Benini , Alberto Macii , Enrico Macii , Massimo Poncino, Optimal sleep transistor synthesis under timing and area constraints, Proceedings of the 18th ACM Great Lakes symposium on VLSI, May 04-06, 2008, Orlando, Florida, USA
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