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Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: SoC targeted mixed-signal test solutions table of contents
Pages: 658 - 663  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Ganesh Srinivasan  Georgia Institute of Technology
Friedrich Taenzler  Texas Instruments
Abhijit Chatterjee  Georgia Institute of Technology
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

Digital and analog centric load boards have well established board check methodologies as part of their "release to production requirements", while for RF load boards this is still an open research issue. Potential faults on RF load can be caused by mechanical/electrical defects of components and sockets used on the board. Hence, we propose a novel methodology to accurately check/diagnose the RF path using only reflection measurements with suitable terminations of these paths. These reflection measurements and derived 'checker equations' are used to accurately diagnose the RF path on the load board during production test at no extra test cost. A pilot test vehicle is used to demonstrate the practical implementation and production worthiness of the proposed board check and diagnosis methodology.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
C. Woodin, M. Goff, "Verification of MMIC on-wafer micro strip TRL calibration," IEEE MTT-S International Microwave Symposium Digest, May 1990, vol. 3, pp: 1029 -- 1032.
 
2
 
3
Microwave Engineering by David M. Pozar.
Collaborative Colleagues:
Ganesh Srinivasan: colleagues
Friedrich Taenzler: colleagues
Abhijit Chatterjee: colleagues