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Software-based self-test of processors under power constraints
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Processor self-test and fault diagnosis table of contents
Pages: 430 - 435  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Jun Zhou  University of Stuttgart Pfaffenwaldring, Stuttgart, Germany
Hans-Joachim Wunderlich  University of Stuttgart Pfaffenwaldring, Stuttgart, Germany
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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Downloads (6 Weeks): 2,   Downloads (12 Months): 14,   Citation Count: 1
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ABSTRACT

Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initialization tests for the whole system. In this paper, for the first time a structural SBST methodology is proposed which optimizes energy, average power consumption, test length and fault coverage at the same time.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
S. M. Thatte and J. A. Abraham, "A Methodology for Functional Level Testing of Microprocessors", in Proceedings of the International Symposium on Fault-Tolerant Computing, 1978, pp. 90--95.
 
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D. Brahme and J. A. Abraham, "Functional Testing of Microprocessors", IEEE Transactions on Computers, Vol. C-33, June 1984, pp. 475--485.
 
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V. Singh, M. Inoue, K. K. Saluja, and H. Fujiwara, "Software-Based Delay Fault Testing of Processor Cores", in Proceedings of the 12th Asian Test Symposium, 2003, pp. 68--77.
 
13
Y. Zorian, "A Distributed BIST Control Scheme for Complex VLSI Devices", in Proceedings of IEEE VLSI Test Symposium, 1993, pp. 4--9.
 
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S. Hellebrand, H.-J. Wunderlich, "Synthesis of Self-Testable Controllers", in Proceedings of European Design Automation Conference (EDAC/ETC/EuroAsic), Paris, France, Mar. 1994, pp. 580--585
 
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Marc Schuller, "Study of the Switching Activity of RISC-Processors exemplified by the Leon-Processor", Thesis No. 2042, 2002, Faculty of Computer Science, University of Stuttgart, Germany (in German)
 
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"The SPARC Architecture Manual, Version 8", SPARC International, Inc., available under the URL: http://www.sparc.com/standards/V8.pdf
 
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Specification of the RISC processor is available at: http://www.iti.uni-stuttgart.de/~bartscgr/hapra05/hapra_skri pt_06062005.pdf
 
25
"Data Sheet: PrimePower Full-Chip Dynamic Power Analysis for Multimillion-Gate Design", Synopsys, Inc.


Collaborative Colleagues:
Jun Zhou: colleagues
Hans-Joachim Wunderlich: colleagues