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Double-sampling single-loop sigma-delta modulator topologies for broadband applications
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Analogue and mixed-signal design table of contents
Pages: 399 - 404  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Mohammad Yavari  University of Tehran, Tehran, Iran
Omid Shoaei  University of Tehran, Tehran, Iran
Angel Rodriguez-Vazquez  Institute of Microelectronics of Seville (IMSE-CNM) Seville, Spain
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

This paper presents novel double sampling high order single-loop sigma-delta modulator structures for wideband applications. To alleviate the quantization noise folding into the inband frequency region, two previously reported techniques are used. The DAC sampling paths are implemented with the single capacitor approach and an additional zero is placed at the half of the sampling frequency of the modulator's noise transfer function (NTF). The detrimental effect of this additional zero on both the NTF and signal transfer function (STF) is also resolved through the proposed modulator architectures with a low additional circuit requirement.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
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2
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3
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8
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Collaborative Colleagues:
Mohammad Yavari: colleagues
Omid Shoaei: colleagues
Angel Rodriguez-Vazquez: colleagues