| Functionality directed clustering for low power MTCMOS design |
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Asia and South Pacific Design Automation Conference
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Proceedings of the 2005 Asia and South Pacific Design Automation Conference
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Shanghai, China
SESSION: Synthesis for low power
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Pages: 862 - 867
Year of Publication: 2005
ISBN:0-7803-8737-6
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Downloads (6 Weeks): 0, Downloads (12 Months): 12, Citation Count: 4
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ABSTRACT
Multi-Threshold CMOS (MTCMOS) is a circuit style that can effectively reduce leakage power consumption. Sleep transistor sizing is the key issue when MTCMOS circuit is designed. If the sleep transistor size is too large, the circuit performance can be maintained but the dynamic power consumption of the sleep transistor will increase. On the other hand, if the sleep transistor size is too small, there will be significant performance degradation because of the increased resistance to ground. Previous approach [1, 2] designed the sleep transistor size based on mutual exclusive discharge patterns. However, these approaches considered only topology of a circuit. We observed that two possible simultaneous switching gates may not discharge at the same time in terms of functionality. Thus, we propose an algorithm to determine how to cluster cells to share sleep transistors taking both topology and functionality into consideration. The results show that the proposed method can achieve on the average 18% reduction ratio in terms of the number of sleep transistors as compared to the method without considering functionality.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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James Kao , Siva Narendra , Anantha Chandrakasan, MTCMOS hierarchical sizing based on mutual exclusive discharge patterns, Proceedings of the 35th annual conference on Design automation, p.495-500, June 15-19, 1998, San Francisco, California, United States
[doi> 10.1145/277044.277180]
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Mohab Anis , Mohamed Mahmoud , Mohamed Elmasry , Shawki Areibi, Dynamic and leakage power reduction in MTCMOS circuits using an automated efficient gate clustering technique, Proceedings of the 39th conference on Design automation, June 10-14, 2002, New Orleans, Louisiana, USA
[doi> 10.1145/513918.514041]
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S. Muth, T. Douseki, T. Matsuya, T. Aoki, S. Shigematsu, and J. Yamada, "1-V Power Supply High-Speed Digital Circuit Technology with Multithreshold-Voltage CMOS," IEEE Journal of Solid-State Circuits, vol. 30, no. 8, pp. 847--853, Feb. 1995.
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James Kao , Anantha Chandrakasan , Dimitri Antoniadis, Transistor sizing issues and tool for multi-threshold CMOS technology, Proceedings of the 34th annual conference on Design automation, p.409-414, June 09-13, 1997, Anaheim, California, United States
[doi> 10.1145/266021.266182]
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Harish Kriplani, Farid N. Najm, Ibrahim N. Hajj, "Pattern Independent Maximum Current Estimation in Power and Ground Buses of CMOS VLSI Circuits: Algorithms, Signal Correlations, and Their Resolution," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 998--1012, 1995.
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CITED BY 4
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Ashoka Sathanur , Antonio Pullini , Luca Benini , Alberto Macii , Enrico Macii , Massimo Poncino, Optimal sleep transistor synthesis under timing and area constraints, Proceedings of the 18th ACM Great Lakes symposium on VLSI, May 04-06, 2008, Orlando, Florida, USA
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Ashoka Sathanur , Luca Benini , Alberto Macii , Enrico Macii , Massimo Poncino, Multiple power-gating domain (multi-VGND) architecture for improved leakage power reduction, Proceeding of the thirteenth international symposium on Low power electronics and design, August 11-13, 2008, Bangalore, India
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A. Sathanur , A. Pullini , L. Benini , A. Macii , E. Macii , M. Poncino, A scalable algorithmic framework for row-based power-gating, Proceedings of the conference on Design, automation and test in Europe, March 10-14, 2008, Munich, Germany
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A. Sathanur , A. Calimera , L. Benini , A. Macii , E. Macii , M. Poncino, Interactive presentation: Efficient computation of discharge current upper bounds for clustered sleep transistor sizing, Proceedings of the conference on Design, automation and test in Europe, April 16-20, 2007, Nice, France
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