Yield driven gate sizing for coupling-noise reduction under uncertainty

ABSTRACT

This paper presents a post-route gate-sizing algorithm for coupling-noise reduction that constrains the yield loss under process variations. Algorithms for coupling-noise reduction which do not consider uncertainty in the manufacturing process can make a circuit susceptible to failure. Using probabilistic models, the coupling-noise reduction problem is solved as a fixpoint computation problem on a lattice. A novel gate-sizing algorithm with low area overhead is proposed for coupling-noise reduction under uncertainty. Experimental results are reported for the ISCAS benchmarks and larger circuits with comparisons to traditional approaches.

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