Equivalent circuit modeling of guard ring structures for evaluation of substrate crosstalk isolation

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Equivalent circuit modeling of guard ring structures for evaluation of substrate crosstalk isolation

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Asia and South Pacific Design Automation Conference archive
Proceedings of the 2006 Asia and South Pacific Design Automation Conference table of contents

Yokohama, Japan

SESSION: Substrate coupling and analog synthesis table of contents

Pages: 677 - 682

Year of Publication: 2006

ISBN:0-7803-9451-8

Authors

Daisuke Kosaka	Kobe University, Nada-ku, Kobe, Japan
Makoto Nagata	Kobe University, Nada-ku, Kobe, Japan

Sponsors

: IEEE Circuits and Systems Society
SIGDA: ACM Special Interest Group on Design Automation
IEICE ESS : Institute of Electronics, Information and Communication Engineers, Engineering Sciences Society
IPSJ SIG-SLDM : Information Processing Society of Japan, SIG System LSI Design Methodology

Publisher

IEEE Press Piscataway, NJ, USA

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Downloads (6 Weeks): 3, Downloads (12 Months): 33, Citation Count: 0

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ABSTRACT

A substrate-coupling equivalent circuit can be derived for an arbitrary guard ring test structure by way of F-matrix computation. The derived netlist represents a unified impedance network among multiple sites on a chip surface and allows circuit simulation for evaluation of isolation effects provided by guard rings. Geometry dependency of guard ring effects attributes to layout patterns of a test structure, including such as area of a guard ring as well as location distance from the circuit to be isolated by the guard ring. In addition, structural dependency arises from vertical impurity concentrations such as p⁺, n⁺, and deep n-well, which are generally available in a deep-submicron CMOS technology. The proposed simulation based prototyping technique of guard ring structures can include all these dependences and thus can be strongly helpful to establish isolation strategy against substrate coupling in a given technology, in an early stage of SoC developments.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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