| A constraint-based solution for on-line testing of processors embedded in real-time applications |
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Proceedings of the 18th annual symposium on Integrated circuits and system design
table of contents
Florianolpolis, Brazil
Pages: 68 - 73
Year of Publication: 2005
ISBN:1-59593-174-0
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Authors
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Marcelo Moraes
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Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
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Érika Cota
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Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
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Luigi Carro
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Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
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Flávio Wagner
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Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
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Marcelo Lubaszewski
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Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
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ABSTRACT
Software-based self-test has been proposed as a low-cost strategy for on-line periodic testing of embedded processors. In this paper, we show that structural test programs composed only by regular deterministic self-test routines may be unfeasible in a real-time embedded platform. Hence, we propose a method to consciously select a set of test routines from different test approaches to compose a test program for an embedded processor. The proposed method not only ensures the periodical execution of the test, but also considers the optimization of memory and real-time requirements of the application, which are important constraints in embedded systems. Experimental results for a Java processor running real-time tasks demonstrate the effectiveness of the proposed solution.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Wehrmeister, M. A., Becker, L. B., and Pereira, C. E. Optimizing Real-Time Embedded Systems Development Using a RTSJ-based API. In Proceedings of the 2nd Workshop on Java Technologies for Real-Time and Embedded Systems (Larnaca, Cyprus, Oct. 25-29) Springer LNCS, 2004.
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Xenoulis, G., Gizopoulos, D., Kranitis, N., and Paschalis, A. Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores. In Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS'03) (Kos Island, Greece, July 7-9, 2003). IEEE Computer Society, 2003, 149--154.
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