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Fundamentals of next generation compact MOSFET models
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Proceedings of the 18th annual symposium on Integrated circuits and system design table of contents
Florianolpolis, Brazil
SESSION: Analog design and modeling table of contents
Pages: 32 - 37  
Year of Publication: 2005
ISBN:1-59593-174-0
Authors
C. Galup-Montoro  Universidade Federal de Santa Catarina, Florianopolis-SC- Brazil
Márcio C. Schneider  Universidade Federal de Santa Catarina, Florianopolis-SC- Brazil
Viriato C. Pahim  Universidade Federal de Santa Catarina, Florianopolis-SC- Brazil
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
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ACM  New York, NY, USA
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ABSTRACT

It has recently become clear that the electronics industry is turning away from source-referenced, threshold voltage based MOSFET models. The two main approaches as candidates to replace BSIM-type models are inversion-charge and surface-potential models. This paper provides an overview of the basic physics that must be modeled to build a compact model for the MOSFET and compares the two approaches taken by the developers of next generation models.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
M. Miura-Mattausch, U. Feldmann, A. Rahm, M. Bollu, and D. Savignac, "Unified complete MOSFET model for analysis of digital and analog circuits," IEEE Trans. Computer-Aided Design, vol. 15, pp. 1--7, January 1996.
 
2
C. Galup-Montoro, M. C. Schneider, and A. I. A. Cunha, "A current-based MOSFET model for integrated circuit design," Chapter 2 of Low-Voltage/Low-Power Integrated Circuits and Systems, pp 7--55, edited by E. Sanchez-Sinencio and A. Andreou, IEEE Press, 1999.
 
3
R. van Langevelde, A. J. Scholten, and D. B. M. Klaassen, "Physical background of MOS model 11", Nat. Lab. Unclassified Report 2003/00239. April 2003. (available on line at <http://www.semiconductors.philips.com/Philips_Models/>)
 
4
G. Gildenblat, H. Wang, T.-L. Chen, X. Gu, and X. Cai, "SP: An advanced surface-potential-based compact MOSFET model", IEEE J. Solid-State Circuits, vol. 39, no. 9, pp. 1394--1406, September 2004.
 
5
 
6
W. Liu et al.. (1999) BSIM3v3 Manual. Dept. Elect. Eng. Comp. Sci., Univ. California, Berkeley. {Online}. Available: <http://wwwdevice.eecs.berkeley.edu/~bsim3/get.html>
 
7
M. A. Maher and C. A. Mead, "A physical charge-controlled model for MOS transistors," in Advanced Research in VLSI, P. Losleben (ed.), MIT Press, Cambridge, MA, 1987.
 
8
Y. Byun, K. Lee and M. Shur, "Unified charge control model and subthreshold current in heterostructure field effect transistors," IEEE Electron Device Letters, vol. 11, no. 1, pp. 50--53, January 1990.
 
9
J.-M. Sallese, M. Bucher, F. Krummenacher, and P. Fazan, "Inversion charge linearization in MOSFET modeling and rigorous derivation of the EKV compact model", Solid-State Electronics vol. 47, pp. 677--683, 2003.
 
10
J. He, X. Xi, M. Chan, A. Niknejad, and C. Hu, "An advanced surface potential-plus MOSFET model," p. 262 in Tech. Proc. 2003 Nanotechnology Conf.
 
11
 
12
H. C. Pao and C. T. Sah, "Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors," Solid-State Electronics, vol. 9, pp. 927--937, 1966.
 
13
G. Baccarani, M. Rudan and G. Spadini, "Analytical i.g.f.e.t. model including drift and diffusion currents", Solid-state and Electron Devices, vol. 2, no. 2, pp. 62--68, March 1978.
 
14
J. R Brews, "A charge sheet model for the MOSFET," Solid-State Electronics, vol.21, pp.345--355, 1978.
 
15
F. Van de Wiele, "A long-channel MOSFET model", Solid-State Electronics, vol. 22, no. 12, pp. 991--997, December 1979.
 
16
A. I. A. Cunha, M. C. Schneider, and C. Galup-Montoro, "Derivation of the unified charge control model and parameter extraction procedure," Solid-State Electronics, vol. 43, no 3, pp. 481--485, March 1999.
 
17
R. Rios, S. Mudanai, W.-K. Shih, and P. Packan, "An efficient surface potential solution algorithm for compact MOSFET models," pp 755-758. IEDM 2004 Tech. Dig.
 
18
E. M. Camacho-Galeano, C. Galup-Montoro and M. C. Schneider, "A 2-nW 1.1-V self-biased current reference in CMOS technology" <http://eel.ufsc.br/lci/pdf/camacho_2005.pdf>, IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 52, no. 2, pp. 61--65, February 2005.

Collaborative Colleagues:
C. Galup-Montoro: colleagues
Márcio C. Schneider: colleagues
Viriato C. Pahim: colleagues