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The need for a full-chip and package thermal model for thermally optimized IC designs
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Source International Symposium on Low Power Electronics and Design archive
Proceedings of the 2005 international symposium on Low power electronics and design table of contents
San Diego, CA, USA
SESSION: Power grid, thermal, and leakage issues table of contents
Pages: 245 - 250  
Year of Publication: 2005
ISBN:1-59593-137-6
Authors
Wei Huang  University of Virginia, Charlottesville, VA
Eric Humenay  University of Virginia, Charlottesville, VA
Kevin Skadron  University of Virginia, Charlottesville, VA
Mircea R. Stan  University of Virginia, Charlottesville, VA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 4,   Downloads (12 Months): 41,   Citation Count: 8
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ABSTRACT

Modeling and analyzing detailed die temperature with a full-chip thermal model at early design stages is important to discover and avoid potential thermal hazards. However, omitting important aspects of package details in a thermal model can result in significant temperature estimation errors. In this paper, we discuss the applications of an existing compact thermal model that models both die and package temperature details. As an example, a thermally self-consistent leakage power calculation of a POWER4-like microprocessor design is presented. We then demonstrate the importance of including detailed package information in the thermal model by several examples considering the impact of thermal interface material (TIM), which glues the die to the heat spreader. The fact that detailed package information is needed to build an accurate compact thermal model implies a design flow, in which the chip- and package-level compact thermal model acts as a convenient medium for more productive collaborations among circuit designers, computer architects and package designers, leading to early and efficient evaluations of different design tradeoffs for an optimal design from a thermal point of view


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  8
 
 
 

Collaborative Colleagues:
Wei Huang: colleagues
Eric Humenay: colleagues
Kevin Skadron: colleagues
Mircea R. Stan: colleagues