|
||||||||||||||||||||||||||||||||||
|
||||||||||||||||||||||||||||||||||
ABSTRACT
In this paper, we examine the cycle time and on-time delivery performance of a semiconductor wafer fabrication facility (wafer fab) under critical ratio (CR) dispatch regime. It turns out that determining appropriate due dates for this rule is a critical task. We provide a detailed analysis of the wafer fab behavior for a large range of due date values. From the results of the experiments we develop a heuristic for conservative due date estimates. REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
|
||||||||||||||||||||||||||||||||||