| An automatic testbench generation tool for a SystemC functional verification methodology |
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Proceedings of the 17th symposium on Integrated circuits and system design
table of contents
Pernambuco, Brazil
SESSION: Verification (co-organized with LA-TTTC)
table of contents
Pages: 66 - 70
Year of Publication: 2004
ISBN:1-58113-947-0
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Downloads (6 Weeks): 8, Downloads (12 Months): 29, Citation Count: 2
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ABSTRACT
The advent of new 90nm/130nm VLSI technology and SoC design methodologies, has brought an explosive growth in the complexity of modern electronic circuits. As a result, functional verification has become the major bottleneck in any design flow. New methods are required that allow for easier, quicker and more reusable verification. In this paper we propose an automatic verification methodology approach that enables fast, transaction-level, coverage-driven, self-checking and random-constraint functional verification. Our approach uses the SystemC Verification Library (SCV), to synthesize a tool capable of automatically generating testbench templates. A case study from a real MP3 design is used to show the effectiveness of our approach.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Bhasker, J., A SystemC Primer Star Galaxy Publishing, 2002.
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REGIMBAL, S., LEMIRE, J.-F., SAVARIA, Y., BOIS, G., ABOULHAMID, M., BARON, A., Automating Functional Coverage Analysis Based On An Executabl e Specification Proc. of the International Workshop on System-on-Chip for Real-Time Applications, Calgary, June, 2003.
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DRUCKER, L., SystemC Verification Library speeds transaction-based verification D&R Industry Articles, EEdesign, EEtimes, February, 2003.
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James Monaco , David Holloway , Rajesh Raina, Functional verification methodology for the PowerPC 604 microprocessor, Proceedings of the 33rd annual conference on Design automation, p.319-324, June 03-07, 1996, Las Vegas, Nevada, United States
[doi> 10.1145/240518.240579]
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