| Soft error and energy consumption interactions: a data cache perspective |
| Full text |
Pdf
(285 KB)
|
Source
|
International Symposium on Low Power Electronics and Design
archive
Proceedings of the 2004 international symposium on Low power electronics and design
table of contents
Newport Beach, California, USA
SESSION: Power optimizations for cache memory
table of contents
Pages: 132 - 137
Year of Publication: 2004
ISBN:1-58113-929-2
|
|
Authors
|
|
Lin Li
|
Pennsylvania State University, University Park, PA
|
|
Vijay Degalahal
|
Pennsylvania State University, University Park, PA
|
|
N. Vijaykrishnan
|
Pennsylvania State University, University Park, PA
|
|
Mahmut Kandemir
|
Pennsylvania State University, University Park, PA
|
|
Mary Jane Irwin
|
Pennsylvania State University, University Park, PA
|
|
| Sponsors |
|
| Publisher |
|
| Bibliometrics |
Downloads (6 Weeks): 4, Downloads (12 Months): 18, Citation Count: 10
|
|
|
ABSTRACT
Energy-efficiency and reliability are two major design constraints influencing next generation system designs. In this work, we focus on the interaction between power consumption and reliability considering the on-chip data caches. First, we investigate the impact of two commonly used architectural-level leakage reduction approaches on the data reliability. Our results indicate that the leakage optimization techniques can have very different reliability behavior as compared to an original cache with no leakage optimizations. Next, we investigate on providing data reliability in an energy efficient fashion in the presence of soft-errors. In contrast to current commercial caches that treat and protect all data using the same error detection/correction mechanism, we present an adaptive error coding scheme that treats dirty and clean data cache blocks differently. Furthermore, we present an early-write-back scheme that enhances the ability to use a less powerful error protection scheme for a longer time without sacrificing reliability. Experimental results show that proposed schemes, when used in conjunction, can reduce dynamic energy of error protection components in L1 data cache by 11% on average without impacting the performance or reliability.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
SPEC CPU2000 benchmark. http://www.spec.org/.
|
 |
2
|
|
 |
3
|
|
| |
4
|
R. Baumann. The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction. In Digest of International Electron Devices Meeting, pages 329--332, 2002.
|
| |
5
|
D. C. Burger and T. M. Austin. The SimpleScalar tool-set, Version 2.0. Technical Report 1342, Dept. of Computer Science, UW, June 1997.
|
 |
6
|
|
| |
7
|
|
 |
8
|
Krisztián Flautner , Nam Sung Kim , Steve Martin , David Blaauw , Trevor Mudge, Drowsy caches: simple techniques for reducing leakage power, Proceedings of the 29th annual international symposium on Computer architecture, p.148, May 25-29, 2002, Anchorage, Alaska
|
| |
9
|
P. Hazucha and C. Svensson. Impact of CMOS technology scaling on the atmospheric neutron soft error rate. IEEE Transactions on Nuclear Science, 47(6), 2000.
|
 |
10
|
Zhigang Hu , Philo Juang , Phil Diodato , Stefanos Kaxiras , Kevin Skadron , Margaret Martonosi , Douglas W. Clark, Managing leakage for transient data: decay and quasi-static 4T memory cells, Proceedings of the 2002 international symposium on Low power electronics and design, August 12-14, 2002, Monterey, California, USA
[doi> 10.1145/566408.566423]
|
| |
11
|
T. Karnik, B. Bloechel, K. Soumyanath, V. De, and S. Borkar. Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18u. In Digest of Technical Papers of Symposium on VLSI Circuits, pages 61--62, 2001.
|
 |
12
|
|
| |
13
|
J. Maiz, S. Hareland, K. Zhang, and P. Armstrong. Characterization of multi-bit soft error events in advanced SRAMs. In Digest of International Electron Devices Meeting, 2003.
|
| |
14
|
|
| |
15
|
N. Seifert, D. Moyer, N. Leland, and R. Hokinson. Historical trend in alpha-particle induced soft error rates of the AlphaTM microprocessor. In Proc. of 39th International Reliability Physics Symposium, pages 259--265, 2001.
|
| |
16
|
|
 |
17
|
|
| |
18
|
F. Wrobel, J.-M. Palau, M.-C. Calvet, O. Bersillon, and H. Duarte. Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections. IEEE Transactions on Nuclear Science, 48(6):1946--1952, 2001.
|
| |
19
|
W. Zhang, S. Gurumurthi, M. Kandemir, and A. Sivasubramaniam. ICR: in-cache replication for enhancing data cache reliability. In Proc. of the International Conference on Dependable Systems and Networks, 2003.
|
| |
20
|
|
CITED BY 10
|
|
Yuan Cai , Marcus T. Schmitz , Alireza Ejlali , Bashir M. Al-Hashimi , Sudhakar M. Reddy, Cache size selection for performance, energy and reliability of time-constrained systems, Proceedings of the 2006 conference on Asia South Pacific design automation, January 24-27, 2006, Yokohama, Japan
|
|
|
|
|
|
|
|
|
|
|
Kyoungwoo Lee , Aviral Shrivastava , Minyoung Kim , Nikil Dutt , Nalini Venkatasubramanian, Mitigating the impact of hardware defects on multimedia applications: a cross-layer approach, Proceeding of the 16th ACM international conference on Multimedia, October 26-31, 2008, Vancouver, British Columbia, Canada
|
|
|
|
|
|
|
Kyoungwoo Lee , Aviral Shrivastava , Ilya Issenin , Nikil Dutt , Nalini Venkatasubramanian, Mitigating soft error failures for multimedia applications by selective data protection, Proceedings of the 2006 international conference on Compilers, architecture and synthesis for embedded systems, October 22-25, 2006, Seoul, Korea
|
|
|
|
|
|