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| 2003
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1
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Prediction of interconnect pattern density distribution: derivation, validation, and applications
Payman Zarkesh-Ha, Ken Doniger, William Loh, Peter Wright
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April 2003
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SLIP '03: Proceedings of the 2003 international workshop on System-level interconnect prediction
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Publisher: ACM
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(388.97 KB)
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| Bibliometrics: Downloads (6 Weeks): 2, Downloads (12 Months): 25, Citation Count: 2 |
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A rigorous derivation of the interconnect pattern density distribution for random logic networks is presented using the Bernoulli probability distribution. The derived analytical model provides a statistical interconnect pattern density distribution ...
Keywords: Stochastic model, interconnect network prediction, interconnect pattern density, probability density function
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Impact of Interconnect Pattern Density Information on a 90nm Technology ASIC Design Flow
Payman Zarkesh-Ha, S. Lakshminarayann, Ken Doniger, William Loh, Peter Wright
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March 2003
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ISQED '03: Proceedings of the 4th International Symposium on Quality Electronic Design
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Publisher: IEEE Computer Society
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| Bibliometrics: Downloads (6 Weeks): n/a, Downloads (12 Months): n/a, Citation Count: 4 |
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The importance of an interconnect pattern densitymodel in ASIC design flow for a 90nm technology ispresented. It is shown that performing the timing analysisat the worst-case corner model for interconnect variation,without the knowledge of interconnect ...
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