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· LSI Logic Corporation
Bibliometrics: publication history
Publication years2003-2003
Publication count2
Citation Count6
Available for download1
Downloads (6 Weeks)2
Downloads (12 Months)25
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2003
1
Prediction of interconnect pattern density distribution: derivation, validation, and applications
Payman Zarkesh-Ha, Ken Doniger, William Loh, Peter Wright
April 2003
SLIP '03: Proceedings of the 2003 international workshop on System-level interconnect prediction
Publisher: ACM
Full text available: PdfPdf (388.97 KB)
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 Bibliometrics:  Downloads (6 Weeks): 2,   Downloads (12 Months): 25,   Citation Count: 2

A rigorous derivation of the interconnect pattern density distribution for random logic networks is presented using the Bernoulli probability distribution. The derived analytical model provides a statistical interconnect pattern density distribution ...

Keywords: Stochastic model, interconnect network prediction, interconnect pattern density, probability density function
 
2
Impact of Interconnect Pattern Density Information on a 90nm Technology ASIC Design Flow
Payman Zarkesh-Ha, S. Lakshminarayann, Ken Doniger, William Loh, Peter Wright
March 2003
ISQED '03: Proceedings of the 4th International Symposium on Quality Electronic Design
Publisher: IEEE Computer Society
Full text available: Publisher SitePublisher Site
Additional Information:full citation, abstract, cited by, index terms
 Bibliometrics:  Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 4

The importance of an interconnect pattern densitymodel in ASIC design flow for a 90nm technology ispresented. It is shown that performing the timing analysisat the worst-case corner model for interconnect variation,without the knowledge of interconnect ...